Intel 640 User Guide - Page 31

Thermal Management Logic and Thermal Monitor Feature

R

Thermal/Mechanical Design Guide

31

4

Thermal Management Logic and

Thermal Monitor Feature

4.1

Processor Power Dissipation

An increase in processor operating frequency not only increases system performance, but also

increases the processor power dissipation. The relationship between frequency and power is

generalized in the following equation: P = CV

2

F (where P = power, C = capacitance,

V = voltage, F = frequency). From this equation, it is evident that power increases linearly with

frequency and with the square of voltage. In the absence of power saving technologies, ever

increasing frequencies will result in processors with power dissipations in the hundreds of watts.

Fortunately, there are numerous ways to reduce the power consumption of a processor, and Intel

is aggressively pursuing low power design techniques. For example, decreasing the operating

voltage, reducing unnecessary transistor activity, and using more power efficient circuits can

significantly reduce processor power consumption.

An on-die thermal management feature called Thermal Monitor is available on the Pentium 4

processor in the 775–land LGA package. It provides a thermal management approach to support

the continued increases in processor frequency and performance. By using a highly accurate on-

die temperature sensing circuit and a fast acting Thermal Control Circuit (TCC), the processor can

rapidly initiate thermal management control. The Thermal Monitor can reduce cooling solution

cost, by allowing thermal designs to target TDP.

4.2

Thermal Monitor Implementation

On the Pentium 4 processor in the 775–land LGA package, the Thermal Monitor is integrated into

the processor silicon includes:

•

A bi-directional signal (PROCHOT#) that indicates if the processor has exceeded its

maximum temperature or can be asserted externally to activate the Thermal Control Circuit

(TCC).

•

A Thermal Control Circuit that will attempt to reduce processor temperature by rapidly

reducing power consumption when the on-die temperature sensor indicates that it has

exceeded the maximum operating point.

•

Registers to determine the processor thermal status.

Section	Page
Contents	3
Figures	6
Tables	7
Revision History	8
1 Introduction	9
1.1 Document Goals and Scope	9
1.1.1 Importance of Thermal Management	9
1.1.2 Document Goals	9
1.1.3 Document Scope	10
1.2 References	11
1.3 Definition of Terms	12
2 Processor Thermal/Mechanical Information	15
2.1 Mechanical Requirements	15
2.1.1 Processor Package	15
2.1.2 Heatsink Attach	17
2.1.2.1 General Guidelines	17
2.1.2.2 Heatsink Clip Load Requirement	17
2.1.2.3 Additional Guidelines	18
2.2 Thermal Requirements	18
2.2.1 Processor Case Temperature	18
2.2.2 Thermal Profile	19
2.2.3 TCONTROL	20
2.3 Heatsink Design Considerations	21
2.3.1 Heatsink Size	22
2.3.2 Heatsink Mass	22
2.3.3 Package IHS Flatness	22
2.3.4 Thermal Interface Material	23
2.4 System Thermal Solution Considerations	23
2.4.1 Chassis Thermal Design Capabilities	23
2.4.2 Improving Chassis Thermal Performance	23
2.4.3 Summary	24
2.5 System Integration Considerations	24
3 Thermal Metrology	25
3.1 Characterizing Cooling Performance Requirements	25
3.1.1 Example	26
3.2 Processor Thermal Solution Performance Assessment	27
3.3 Local Ambient Temperature Measurement Guidelines	27
3.4 Processor Case Temperature Measurement Guidelines	30
4 Thermal Management Logic and Thermal Monitor Feature	31
4.1 Processor Power Dissipation	31
4.2 Thermal Monitor Implementation	31
4.2.1 PROCHOT# Signal	32
4.2.2 Thermal Control Circuit	32
4.2.3 Operation and Configuration	33
4.2.4 On-Demand Mode	34
4.2.5 System Considerations	34
4.2.6 Operating System and Application Software Considerations	35
4.2.7 On-Die Thermal Diode	35
4.2.7.1 Reading the On-Die Thermal Diode Interface	35
4.2.7.2 Correction Factors for the On-Die Thermal Diode	36
4.2.8 THERMTRIP# Signal	37
4.2.8.1 Cooling System Failure Warning	37
5 Intel® Thermal/Mechanical Reference Design Information	39
5.1 Intel Validation Criteria for the Reference Design	39
5.1.1 Heatsink Performance Target	39
5.1.2 Acoustics	40
5.1.3 Altitude	40
5.1.4 Reference Heatsink Thermal Validation	41
5.1.5 Fan Performance for Active Heatsink Thermal Solution	41
5.2 Environmental Reliability Testing	42
5.2.1 Structural Reliability Testing	42
5.2.1.1 Random Vibration Test Procedure	42
5.2.1.2 Shock Test Procedure	42
5.2.2 Power Cycling	44
5.2.3 Recommended BIOS/Processor/Memory Test Procedures	44
5.3 Material and Recycling Requirements	44
5.4 Safety Requirements	45
5.5 Geometric Envelope for ATX Intel® Reference Thermal Mechanical Design	45
5.6 ATX Reference Thermal Mechanical Solution for the Intel® Pentium® 4 Processor in the 775–Land LGA Package	46
5.7 Reference Attach Mechanism	48
5.7.1 Structural Design Strategy	48
5.7.2 Mechanical Interface to the Reference Attach Mechanism	49
6 Acoustic Fan Speed Control	53
6.1 Acoustic Fan Speed Control	53
6.2 Thermal Solution Design	53
6.2.1 Compliance to Thermal Profile	53
6.2.2 Determine Thermistor Set Points	53
6.2.3 Minimum Fan Speed Set Point	54
6.3 Board and System Implementation	55
6.3.1 Choosing Fan Speed Control Settings	55
6.3.1.1 Temperature to begin Fan Acceleration	56
6.3.1.2 Minimum PWM Duty Cycle	58
6.4 Combining Thermistor and Thermal Diode Control	59

Intel 640 User Guide - Page 31

Thermal Management Logic and, Thermal Monitor Feature

Page 31 highlights