AMD AMD-K6-2/500AFX Data Sheet - Page 140

TDI (Test Data Input), 4.49 TMS (Test Mode Select), Input, Internal Pullup, Output

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AMD-K6®-2 Processor Data Sheet Preliminary Information 21850J/0-February 2000 Sampled The processor always samples TCK, except while TRST# is asserted. 4.47 Summary Sampled TDI (Test Data Input) Input, Internal Pullup TDI is the serial test data and instruction input for boundary-scan testing using the Test Access Port (TAP). See "Boundary-Scan Test Access Port (TAP)" on page 223 for details regarding the operation of the TAP controller. The processor samples TDI on every rising TCK edge but only while in the Shift-IR and Shift-DR states. 4.48 TDO (Test Data Output) Output Summary Driven and Floated TDO is the serial test data and instruction output for boundary-scan testing using the Test Access Port (TAP). See "Boundary-Scan Test Access Port (TAP)" on page 223 for details regarding the operation of the TAP controller. The processor drives TDO on every falling TCK edge but only while in the Shift-IR and Shift-DR states. TDO is floated at all other times. 4.49 Summary Sampled TMS (Test Mode Select) Input, Internal Pullup TMS specifies the test function and sequence of state changes for boundary-scan testing using the Test Access Port (TAP). See "Boundary-Scan Test Access Port (TAP)" on page 223 for details regarding the operation of the TAP controller. The processor samples TMS on every rising TCK edge. If TMS is sampled High for five or more consecutive clocks, the TAP controller enters its Test-Logic-Reset state, regardless of the controller state. This action is the same as that achieved by asserting TRST#. 120 Signal Descriptions Chapter 4

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120
Signal Descriptions
Chapter 4
AMD-K6
®
-2 Processor Data Sheet
21850J/0—February 2000
Preliminary Information
Sampled
The processor always samples TCK, except while TRST# is
asserted.
4.47
TDI (Test Data Input)
Input, Internal Pullup
Summary
TDI is the serial test data and instruction input for
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 223 for details
regarding the operation of the TAP controller.
Sampled
The processor samples TDI on every rising TCK edge but only
while in the Shift-IR and Shift-DR states.
4.48
TDO (Test Data Output)
Output
Summary
TDO is the serial test data and instruction output for
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 223 for details
regarding the operation of the TAP controller.
Driven and Floated
The processor drives TDO on every falling TCK edge but only
while in the Shift-IR and Shift-DR states. TDO is floated at all
other times.
4.49
TMS (Test Mode Select)
Input, Internal Pullup
Summary
TMS specifies the test function and sequence of state changes
for boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 223 for details
regarding the operation of the TAP controller.
Sampled
The processor samples TMS on every rising TCK edge. If TMS is
sampled High for five or more consecutive clocks, the TAP
controller enters its Test-Logic-Reset state, regardless of the
controller state. This action is the same as that achieved by
asserting TRST#.