AMD AMD-K6-2/500AFX Data Sheet - Page 140
TDI (Test Data Input), 4.49 TMS (Test Mode Select), Input, Internal Pullup, Output
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AMD-K6®-2 Processor Data Sheet Preliminary Information 21850J/0-February 2000 Sampled The processor always samples TCK, except while TRST# is asserted. 4.47 Summary Sampled TDI (Test Data Input) Input, Internal Pullup TDI is the serial test data and instruction input for boundary-scan testing using the Test Access Port (TAP). See "Boundary-Scan Test Access Port (TAP)" on page 223 for details regarding the operation of the TAP controller. The processor samples TDI on every rising TCK edge but only while in the Shift-IR and Shift-DR states. 4.48 TDO (Test Data Output) Output Summary Driven and Floated TDO is the serial test data and instruction output for boundary-scan testing using the Test Access Port (TAP). See "Boundary-Scan Test Access Port (TAP)" on page 223 for details regarding the operation of the TAP controller. The processor drives TDO on every falling TCK edge but only while in the Shift-IR and Shift-DR states. TDO is floated at all other times. 4.49 Summary Sampled TMS (Test Mode Select) Input, Internal Pullup TMS specifies the test function and sequence of state changes for boundary-scan testing using the Test Access Port (TAP). See "Boundary-Scan Test Access Port (TAP)" on page 223 for details regarding the operation of the TAP controller. The processor samples TMS on every rising TCK edge. If TMS is sampled High for five or more consecutive clocks, the TAP controller enters its Test-Logic-Reset state, regardless of the controller state. This action is the same as that achieved by asserting TRST#. 120 Signal Descriptions Chapter 4