AMD AMD-K6-2/500AFX Data Sheet - Page 251
TAP Instructions, Bypass Register BR., EXTEST., Table 50., Supported Tap Instructions
View all AMD AMD-K6-2/500AFX manuals
Add to My Manuals
Save this manual to your list of manuals |
Page 251 highlights
21850J/0-February 2000 Preliminary Information AMD-K6®-2 Processor Data Sheet Bypass Register (BR). The BR is a Test Data Register consisting of a 1-bit shift register that provides the shortest path between TDI and TDO. When the processor is not involved in a test operation, the BR can be selected by an instruction to allow the transfer of test data through the processor without having to serially scan the test data through the BSR. This functionality preserves the state of the BSR and significantly reduces test time. The BR register is selected by the BYPASS and HIGHZ instructions as well as by any instructions not supported by the AMD-K6-2 processor. TAP Instructions The processor supports the three instructions required by the IEEE 1149.1 standard - EXTEST, SAMPLE/PRELOAD, and BYPASS - as well as two additional optional instructions - IDCODE and HIGHZ. Table 50 shows the complete set of TAP instructions supported by the processor along with the 5-bit Instruction Register encoding and the register selected by each instruction. Table 50. Supported Tap Instructions Instruction Encoding Register Description EXTEST1 00000b BSR Sample inputs and drive outputs SAMPLE / PRELOAD 00001b BSR Sample inputs and outputs, then load the BSR IDCODE 00010b DIR Read DIR HIGHZ 00011b BR Float outputs and bidirectional pins BYPASS2 00100b-11110b BR Undefined instruction, execute the BYPASS instruction BYPASS3 11111b BR Connect TDI to TDO to bypass the BSR Notes: 1. Following the execution of the EXTEST instruction, the processor must be reset in order to return to normal, non-test operation. 2. These instruction encodings are undefined on the AMD-K6-2 processor and default to the BYPASS instruction. 3. Because the TDI input contains an internal pullup, the BYPASS instruction is executed if the TDI input is not connected or open during an instruction scan operation. The BYPASS instruction does not affect the normal operational state of the processor. EXTEST. When t he EX TEST inst ruct ion is executed, t he processor loads the BSR shift register with the current state of the input and bidirectional pins in the Capture-DR state and drives the output and bidirectional pins with the corresponding values from the BSR output register in the Update-DR state. Chapter 11 Test and Debug 231