Intel BFCBASE Data Sheet - Page 22
CMOS Asynchronous and Open Drain Asynchronous Signals, 2.8 Test Access Port (TAP) Connection
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Electrical Specifications Table 2-5. Table 2-5 outlines the signals which include on-die termination (RTT). Table 2-6 outlines non AGTL+ signals including open drain signals. Table 2-7 provides signal reference voltages. AGTL+ Signal Description Table AGTL+ signals with RTT1 AGTL+ signals with no RTT A[39:3]#, ADS#, ADSTB[1:0]#, AP[1:0]#, BINIT#, BNR#, BPRI#, D[63:0]#, DBI[3:0]#, DBSY#, DEFER#, DP[3:0]#, DRDY#, DSTBN[3:0]#, DSTBP[3:0]#, HIT#, HITM#, LOCK#, MCERR#, REQ[4:0]#, RS[2:0]#, RSP#, TRDY# BPM[5:0]#, BPMb[3:0]#, RESET#, BR[1:0] Table 2-6. Note: 1. Signals that have RTT in the package with 50 Ω pullup to VTT. Non AGTL+ Signal Description Table Signals with RTT Signals with no RTT A20M#, BCLK[1:0], BSEL[2:0], COMP[3:0], FERR#/PBE#, FORCEPR#, GTLREF_ADD_MID, GTLREF_ADD_END, GTLREF_DATA_MID, GTLREF_DATA_END, IERR#, IGNNE#, INIT#, LINT0/INTR, LINT1/NMI, LL_ID[1:0], PROC_ID[1:0], PECI, PROCHOT#, PWRGOOD, SKTOCC#, SMI#, STPCLK#, TCK, TDI, TDO, TESTHI[1:0], TESTIN1, TESTIN2, THERMTRIP#, TMS, TRST#, VCC_SENSE, VCC_SENSE2, VID[6:1], VSS_SENSE, VSS_SENSE2, VTT_SEL Table 2-7. Signal Reference Voltages GTLREF CMOS A[39:3]#, ADS#, ADSTB[1:0]#, AP[1:0]#, BINIT#, BNR#, BPM[5:0]#, BPMb[3:0]#, BPRI#, BR[1:0]#, D[63:0]#, DBI[3:0]#, DBSY#, DEFER#, DP[3:0]#, DRDY#, DSTBN[3:0]#, DSTBP[3:0]#, FORCEPR#, HIT#, HITM#, LOCK#, MCERR#, RESET#, REQ[4:0]#, RS[2:0]#, RSP#, TRDY# A20M#, LINT0/INTR, LINT1/NMI, IGNNE#, INIT#, PWRGOOD, SMI#, STPCLK#, TCK, TDI, TMS, TRST# 2.7 CMOS Asynchronous and Open Drain Asynchronous Signals Legacy input signals such as A20M#, IGNNE#, INIT#, SMI#, and STPCLK# utilize CMOS input buffers. Legacy output signals such as FERR#/PBE#, IERR#, PROCHOT#, THERMTRIP#, and TDO utilize open drain output buffers. All of the CMOS and Open Drain signals are required to be asserted/deasserted for at least eight BCLKs in order for the processor to recognize the proper signal state. See Section 2.11 and Section 2.12 for the DC and AC specifications. See Section 7 for additional timing requirements for entering and leaving the low power states. 2.8 Test Access Port (TAP) Connection Due to the voltage levels supported by other components in the Test Access Port (TAP) logic, it is recommended that the processor(s) be first in the TAP chain and followed by any other components within the system. A translation buffer should be used to connect to the rest of the chain unless one of the other components is capable of accepting an input of the appropriate voltage. Similar considerations must be made for TCK, TMS, and TRST#. Two copies of each signal may be required with each driving a different voltage level. 22 Document Number: 318080-002