HP StorageWorks 2/16V Brocade Fabric OS Command Reference Manual (53-1000240-0 - Page 86

centralMemoryTest

Page 86 highlights

2 Note: Enter commands in lowercase only; mixed case is for readability. centralMemoryTest centralMemoryTest Tests ASIC-pair central memory operation. Synopsis centralmemorytest [--slot slotnumber][-passcnt count][-datatype type][-ports itemlist][-seed] Description Use this command to execute an address and data bus verification of the ASIC SRAMs that serve as the central memory. Note This command cannot be executed on an enabled switch. You must first disable the switch using the switchDisable command. This command is supported only on the SilkWorm 3250, 3850, 3900, and 24000 platforms. Note The execution of this command is subject to Admin Domain restrictions that may be in place. The test consists of six subtests, each described next. Built-in Self-repair Subtest The BISR subtest executes the built-in self-repair (BISR) circuitry in each ASIC. The BISR executes its own BIST, and cells found to be bad are replaced by redundant rows provided in each SRAM in the ASIC. Once the cells are replaced, the BIST is executed again. The firmware sets up the hardware for the BISR/BIST operation and checks the results. If the done bit in each SRAM is not set within a time-out period, it reports the DIAG-CMBISRTO. If any of the SRAMs within the ASIC fails to map out the bad rows, its fail bit is set and the DIAG-CMBISRF error generated. Data Read/Write Subtest The data write/read subtest executes the address and data bus verifications by running a specified unique ramp pattern D to all SRAMs in all ASICs in the switch. When all SRAMs are written with pattern D, the SRAMs are read and compared against the data previously written. This procedure is repeated with the complemented pattern ~D to ensure that each data bit is toggled during the test. The default pattern used (by POST also) is a QUAD_RAMP with a seed value of 0. ASIC-to-ASIC Connection Subtest Note This subtest is not available on 2 Gbit/sec-capable switches. The ASIC-to-ASIC connection subtest verifies that any port can read the data from any of the ASICs in the switch, thus verifying both the logic transmitting and receiving the data and the physical transmit data paths on the main board connecting all the ASICs to each other. The test method is as follows: 1. Fill the central memory of all ASICs with unique frames. 2-52 Fabric OS Command Reference Manual Publication Number: 53-1000240-01

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2-52
Fabric OS Command Reference Manual
Publication Number: 53-1000240-01
centralMemoryTest
2
Note: Enter commands in lowercase only; mixed case is for readability.
centralMemoryTest
Tests ASIC-pair central memory operation.
Synopsis
centralmemorytest
[
--slot
slotnumber
][
-passcnt
count
][
-datatype
type
][
-ports
itemlist
][
-seed
]
Description
Use this command to execute an address and data bus verification of the ASIC SRAMs that serve as the
central memory.
Note
This command cannot be executed on an enabled switch. You must first disable the switch using the
switchDisable
command.
This command is supported only on the SilkWorm 3250, 3850, 3900, and 24000 platforms.
Note
The execution of this command is subject to Admin Domain restrictions that may be in place.
The test consists of six subtests, each described next.
Built-in Self-repair Subtest
The BISR subtest executes the built-in self-repair (BISR) circuitry in each ASIC. The BISR executes its
own BIST, and cells found to be bad are replaced by redundant rows provided in each SRAM in the
ASIC. Once the cells are replaced, the BIST is executed again.
The firmware sets up the hardware for the BISR/BIST operation and checks the results. If the done bit in
each SRAM is not set within a time-out period, it reports the DIAG-CMBISRTO. If any of the SRAMs
within the ASIC fails to map out the bad rows, its fail bit is set and the DIAG-CMBISRF error generated.
Data Read/Write Subtest
The data write/read subtest executes the address and data bus verifications by running a specified unique
ramp pattern D to all SRAMs in all ASICs in the switch. When all SRAMs are written with pattern D,
the SRAMs are read and compared against the data previously written. This procedure is repeated with
the complemented pattern ~D to ensure that each data bit is toggled during the test.
The default pattern used (by POST also) is a QUAD_RAMP with a seed value of 0.
ASIC-to-ASIC Connection Subtest
Note
This subtest is not available on 2 Gbit/sec-capable switches.
The ASIC-to-ASIC connection subtest verifies that any port can read the data from any of the ASICs in
the switch, thus verifying both the logic transmitting and receiving the data and the physical transmit data
paths on the main board connecting all the ASICs to each other.
The test method is as follows:
1.
Fill the central memory of all ASICs with unique frames.