HP StorageWorks MSA 2/8 HP StorageWorks Fabric OS V3.1.x/4.1.x Reference Guide - Page 91

centralMemoryTest Subtest 6 Operands The forced bad chip number error subtest verifies that the bad buffer number in the data packet can be detected, its error flag and interrupt bits are set. The test method is as follows: 1. Clear the error and interrupt bits of all ASICs. 2. Set up the hardware so that transmission of data includes a bad buffer number. 3. For each ASIC X in the switch, do: For each of the 11 possible offsets, do: a. Write a 64 byte pattern in the Central Memory. b. Read X from all ASIC Y in the switch. c. Check that all ASIC Y has its: - Its interrupt status are set. - An error type of chip number error. - The port number in error is the receiver port (which is the base port of asic Y). d. Reading the error register clears the CMEM interrupt bit; ready for the next offset to test. This command has the following operands: passcount (V3.1.x only) datatype (V3.1.x only) Specify the number of test passes to run. By default the test will be run one time. The passcount parameter may be used to run the specified number of passes. Specify the type of data pattern to use. By default, type 9, QUAD_RAMP is used. For a complete list of supported data patterns, run the dataTypeShow command. Some common settings are: ■ 1 Byte fill pattern. ■ 2 Word fill pattern. ■ 3 Quad fill pattern. ■ 9 Quad ramp (Addr=Data) pattern. ■ 11 Random data. Fabric OS Version 3.1.x/4.1.x Reference Guide 91