HP StorageWorks 2/64 HP StorageWorks Fabric OS 5.x Command Reference Guide (AA - Page 75

Chip number error subtest The forced bad chip number error subtest verifies that the bad buffer number in the data packet can be detected and its error flag and interrupt bits set. The test method is as follows: 1. Clear the error and interrupt bits of all ASICs. 2. Set up the hardware so that transmission of data includes a bad buffer. 3. For each of the 11 possible offsets for each ASIC X in the switch: a. Write a 64-byte pattern in the central memory. b. Read X from all ASIC Y in the switch. c. For all ASIC Y, ensure: • interrupt status bits set. • the error type is chip number error. • the port number in error is the receiver port (which is the base port of ASIC Y). Reading the error register clears the CMEM interrupt bit, preparing for the next offset to test. Operands This command has the following operands: --slot slotnumber -passcnt count -datatype type Specify the slot number on which the diagnostic will operate. The ports specified will be relative to this slot number. The default is set to 0 and designed to operate on fixed port-count products. Specify the number of test passes to run. By default, the test runs one time. Specify the type of data pattern to use. By default, type 9, QUAD_RAMP, is used. For a complete list of supported data patterns, run the dataTypeShow command. Some common settings are: 1 BYTE_FILL pattern 2 WORD_FILL pattern 3 QUAD_FILL pattern 9 QUAD_RAMP (Addr=Data) pattern -ports itemlist -seed value 11 RANDOM pattern Specify a list of blade ports to test. The Ports list is translated into a matching Quad list before the test is run. By default, all the blade ports in the specified slot (--slot) are tested. See itemList for more information. Specify the data pattern seed to be used. The default seed value is 0. Fabric OS 5.x command reference guide 75